G02300 - SEMI G23 - 半導体パッケージの内部導体路のインダクタンスのための試験方法 StdPbc-0924 • Ammonia (NH3)

• Ammonia (NH3)

This Document can be used as a Guide for equipment manufacturers during the design and testing of their equipment and by those who either use or produce reticles and other EES items

Structural defects formed in the bulk of a silicon wafer during its growth or induced by electronic device processing can affect the performance of the circuitry fabricated on that wafer

previously published July 2013

G02300 - SEMI G23 - 半導体パッケージの内部導体路のインダクタンスのための試験方法 StdPbc-0924 • Ammonia (NH3)global Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org198019969 Referenced SEMI Standards None.